Condensed Matter

   

Dynamic Diffraction Direct Detector

Authors: George Rajna

Advances in electron microscopy – using electrons as imaging tools to see things well beyond the reach of conventional microscopes that use light – have opened up a new window into the nanoscale world and brought a wide range of samples into focus as never before. [37] "We put the optical microscope under a microscope to achieve accuracy near the atomic scale," said NIST's Samuel Stavis, who served as the project leader for these efforts. [36]

Comments: 64 Pages.

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Submission history

[v1] 2019-02-27 10:10:17

Unique-IP document downloads: 4 times

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