Authors: George Rajna
With X-ray microscopes, researchers at PSI look inside computer chips, catalysts, small pieces of bone, or brain tissue.  Now, scientists at the National Synchrotron Light Source II (NSLS-II)—a U.S. Department of Energy (DOE) Office of Science User Facility at DOE's Brookhaven National Laboratory—have developed a TXM that can image samples 10 times faster than previously possible.  In a new study published Aug. 17 in Nature Communications, Nemsak, Fadley, Schneider and colleagues demonstrate the use of new techniques in X-ray spectroscopy to illuminate the internal structure of manganese-doped gallium arsenide. 
Comments: 53 Pages.
[v1] 2019-02-02 04:43:30
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