Classical Physics

   

Zero-Aberration, Actinic, EUV Mask Inspection Microscope with High Defect Sensitivity

Authors: Kenneth C. Johnson

This paper describes an EUV spot-scanning microscope, which performs actinic, through-pellicle photomask inspection for EUV lithography. A primary benefit of spot-scanning microscopy is that it provides access to each illuminated spot’s angular reflectance spectrum, which is sensitive to pure-phase mask defects. Additionally, the spot generation and detection optics can entirely nullify geometric aberrations in the imaging system, potentially resulting in simplified, lower-cost and higher-performing imaging optics.

Comments: 13 Pages.

Download: PDF

Submission history

[v1] 2015-11-16 10:07:26
[v2] 2016-01-25 13:18:52

Unique-IP document downloads: 88 times

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